Universal, Easily Accessible Approach to Measure Layer Number in 2D Materials 2Dmaterials nanoscience nanomaterials microscopy opticalmicroscope opticalmicroscopy acsnano
By Hussain AhmedSep 13 2022Reviewed by Megan Craig, M.Sc. Optical contrast is a popular preliminary approach for determining the layer numbers in two-dimensional materials. However, it is rarely employed as a confirmation technique.
Two-Dimensional Materials: Overview and Significance Two-dimensional materials are made up of one or very few atomic layers of substances that have fascinating optoelectronic characteristics. Two-dimensional materials have found several applications in sensing and quantum computing due to their exceptional features like high surface-to-volume ratio, surface charge, form, high degree of anisotropy, and tunable chemical activity.
Fabrication Methods of Two-Dimensional Materials Related StoriesVarious approaches may be used to manufacture two-dimensional materials. While these processes differ greatly, they may be categorized as either top-down procedures, in which the two-dimensional materials are extracted from a bulk source, or bottom-up techniques, in which the two-dimensional materials are produced to the appropriate specifications.
The optical contrast approach, on the other hand, requires just a basic optical microscope imaging apparatus, making it very efficient and cheap. Many previous studies have used optical microscope images to identify layer numbers in two-dimensional materials. A Fresnel-reflectance-based scanning model was employed to compute and validate the observed intensity ratio. Moreover, the researchers developed a MATLAB-based graphical user interface that can quickly determine layer numbers in two-dimensional materials.
Future Outlook The slope technique and GUI established in this work do not need specific equipment, making them suitable for use in any lab equipped with an optical microscope. Based on these discoveries, it is reasonable to expect that this approach may be applied to any two-dimensional material. A repository of slope and ratio values for various two-dimensional materials on various substrates can be built for quick identification of layer numbers.
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